Flying Probe Test and Boundary Scan (Part 1)

Proven Teamwork

Increased cost-push for electronics manufacturers especially regarding testing as a non-value-adding process arises the questions which ATE in what combination and with what test strategy is the most efficient one. More and more, the use of adapterless working test systems is discussed. A new ATE solution extended for adapterless in-circuit-test in this way is introduced here. It bases on the innovative coupling of a flying prober and Boundary Scan. The second part of the article will contain a case study describing a working system combination and a concrete practical application example.


Quo Vadis Test Strategies?

Which production manager does not wish to have it: a test strategy that detects all occurring failures in a flash, localizes them with exact position, of course, uses but one process step, requires only few test preparation and needs only a low-cost tester. On rational inspection, it is like searching for the perpetuum mobile. It fails because of the physics. The only practical way is the definition of a proper mix of different test strategies optimized for the respective process quality, adapted to product and quantity, just to mention some of the parameters. Such an individual decision-making process requires exact knowledge of both manufacturing process and available test procedures including all their different characteristics. 
Over the last years, more and more new test strategies have been introduced as reaction to the changing range of failures and increasing unit under test (UUT) complexity. Table 1 gives an overview of current strategies. 



Table 1: Overview of test strategies for the check of electronic devices



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